Hüseyin Utku YILMAZ

Thin Film Supervisor | Optical Coatings Engineer | Physicist

📍 Gaziemir, Izmir / Türkiye

I am an Electrical-Electronics Engineer and Physicist specializing in Physical Vapor Deposition (PVD), optical thin film design (E-beam, IBAD), and vacuum system maintenance. Experienced in Class 10000 cleanroom environments, multi-layer coating design using OptiLayer, and comprehensive thin film characterization.

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Work Experience

Thin Film Supervisor

OZ Optics Ltd.
05.05.2025 – Present

Industry Specific Experiences

  • Physical Vapor Deposition (PVD) system operation and process optimization.
  • E-beam evaporation and Ion Beam Assisted Deposition (IBAD).
  • Multi-layer thin film production and optical monitoring thickness control systems.
  • Vacuum system troubleshooting and preventive maintenance.
  • Thin film design utilizing OptiLayer software.
  • Class 10000 Cleanroom production experience.

Soft Skills & Leadership

Technical Leadership • Team Building & Development • Cross-functional Collaboration • Structured Problem Solving • International Communication • Decision Making Under Pressure

Project Manager

Materix Nano Technology A.Ş.
22.05.2023 – 02.05.2025

Industry Specific Experiences

  • New product development and product performance improvement.
  • Thin film characterization through SEM, FTIR, UV-Vis, Particle Size, and Zeta Potential.
  • Sol-gel anti-reflective coatings and hydrophilic/hydrophobic surface treatments.
  • Preparation of Standard Operating Procedures (SOP) and Bill of Materials (BOM).

Soft Skills & Leadership

Team Building & Leadership • Motivation & Mentoring • Employee Training Plans • Project Management

Thin Film Engineer

OZ Optics Ltd.
01.06.2021 – 20.02.2023

Industry Specific Experiences

  • Anti-reflective thin film (SiO2, Ta2O5 layer-by-layer coating) design, characterization, and production.
  • Operation, troubleshooting, and maintenance of Physical Vapor Deposition systems.
  • Standard Operating Procedure (SOP) preparation.
  • Class 10000 Cleanroom hands-on experience.

Research Scientist Intern

Süleyman Demirel University
16.09.2019 – 25.10.2019
  • Thin film organic solar cell production using Ultrasonic Spray Pyrolysis and PVD systems.
  • Thin film characterization using UV-Vis Spectrometer, AFM, XRD, SEM, and E/OC.
  • Designed reflection measurement stage for Perkin Elmer Lambda 20 UV-Vis Spectrometer.
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Job-Related Technical Skills

Deposition & Vacuum Systems

  • TecPort Symphony 9, Vaksis Midas 4T1M
  • Ferrotec E-beam Evaporation
  • KRI Ion Beam Source
  • Intellemetrics Optical Monitoring System
  • Inficon Crystal Thickness Monitor
  • Sono-Tek Ultrasonic Spray Pyrolysis, Dip & Spin Coating

Troubleshooting & Maintenance

  • E-Beam Gun & E-Beam Controller Maintenance
  • Ion Beam Gun Maintenance
  • Optical Monitoring System Maintenance & Calibration
  • Chiller Units & Planetary Gear Maintenance
  • Water and Gas Manifolds Systems

Design & Characterization Tools

  • Perkin Elmer 750 Photo-spectrometer & FTIR
  • Bruker D8 Advance Twin-Twin XRD
  • Nanomagnetics ezAFM & FEI Quanta FEG 250 SEM
  • Keithley 2400 Electro-Optic Measurement
  • OptiLayer, OptiRE, Intellemetrics FilmMaker

Software & Electronics

  • Programming: C#, C++, Assembly
  • Algorithm & Electronic System Design
  • Arduino Microcontroller Integration
  • C# User Interface Development
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Education

GPA 3.39 / 4.00

B.Sc. in Physics

Süleyman Demirel University08.09.2015 – 20.11.2019

Focus: Solid State Physics, X-Ray Diffraction, Vacuum Systems, Solar Cells.

GPA 2.87 / 4.00

B.Sc. in Electrical & Electronics Engineering

Süleyman Demirel University01.09.2014 – 13.11.2019

Focus: Algorithm Design, C#/C++/Assembly Programming, Electronic Theory & System Design.

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Publications

Alishah, H. M., Kazici, M., Ongül, F., Bozar, S., Cantürk Rodop, M., Kahveci, C., ... & Günes, S. (2020).Effect of UV exposure of ITO/PEDOT: PSS substrates on the performance of inverted-type perovskite solar cells. Journal of Materials Science: Materials in Electronics, 31(10), 7968-7980.

🔗 View Article on Springer (DOI)